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dc.contributor.authorZehor Allam, Abdelkader Hamdoune, Chahrazed Boudaoud-
dc.date.accessioned2013-12-22T10:41:39Z-
dc.date.available2013-12-22T10:41:39Z-
dc.date.issued2013-12-22-
dc.identifier.issnwaf-
dc.identifier.urihttp://hdl.handle.net/123456789/3562-
dc.descriptionThe INTERNATIONAL CONFERENCE ON ELECTRONICS & OIL: FROM THEORY TO APPLICATIONS March 05-06, 2013, Ouargla, Algeriaen_US
dc.description.abstractIn this paper, we consider an AlGaN/GaN/AlN ultraviolet (UV) photodetector. We first describe internal characteristics; and then we simulate carriers’ mobility as a function of temperature, dark current as a function of anode voltage, and photocurrent versus optical wavelength. The device exhibits at room temperature, hole mobility of about 150 cm2/Vs, electron mobility of about 350 cm2/Vs, a low dark current of about 10-12 A for a reverse bias of 10 V, a current equal to zero for a forward bias, and a photocurrent peak of 1.45 nA at a wavelength of 340 nm, under 0.5 V bias.en_US
dc.language.isoenen_US
dc.subjectGallium nitride (GaN)en_US
dc.subjectaluminum nitride (AlN)en_US
dc.subjectaluminum gallium nitride (AlGaN)en_US
dc.titlePerformance of an AlGaN/GaN/AlN UV Photodetector.en_US
dc.typeArticleen_US
Appears in Collections:3. Faculté des sciences appliquées

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